X-ray characterization of surfaces irradiated with highly charged ions

被引：7
|
作者：
Briand, J. P. [1 ,2 ]
Benhachoum, M.
机构：
[1] Univ P & M Curie, Lab Kastler Brossel, Paris, France
[2] Ion Surface Adv Proc ISAP, F-92160 Antony, France
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2009年 / 267卷 / 04期
关键词：
Highly charged ions; Hollow atoms; Surface diagnostics; MULTICHARGED IONS; METAL-SURFACE; HOLLOW ATOMS; NEUTRALIZATION; EXCITATION;
D O I：
10.1016/j.nimb.2008.11.050
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Highly charged ions (HCI) approaching, touching or penetrating dielectric surfaces extract many electrons of the solid leading to the formation of permanent surface modifications. The ions which capture the electrons in their outermost shells form hollow atoms which emit X-rays during their decay to the ground state. In this paper one presents experiments showing that these X-rays) allow diagnosing the electric nature of the surfaces. HCI while modifying the structure of surfaces may then also be used to diagnose these changes on line or off line. (C) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码：665 / 668
页数：4
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