A Student's Introduction to Resonant Inelastic Soft X-ray Scattering

被引：0
|
作者：
Chiuzbaian, Sorin G. [1 ,2 ]
机构：
[1] Univ Paris 06, Lab Chim Phys Mat & Rayonnement, 11 Rue Pierre & Marie Curie, F-75005 Paris, France
[2] CNRS, UMR 7614, F-75005 Paris, France
来源：
MAGNETISM AND SYNCHROTRON RADIATION: TOWARDS THE FOURTH GENERATION LIGHT SOURCES | 2013年 / 151卷
关键词：
ELECTRONIC-STRUCTURE; SPECTROMETER; RESOLUTION; NIO; SPECTROGRAPH; EXCITATIONS; SYSTEM;
D O I：
10.1007/978-3-319-03032-6_6
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Recent instrumental advances have opened an important window for studying magnetic excitations with resonant inelastic x-ray scattering (RIXS). This contribution outlines the main theoretical and experimental aspects underlying this spectroscopic technique. The aspects discussed cover self-absorption corrections, scattering geometry, resonant scattering cross sections and methods for identifying and exploiting spectral information. State of the art diffraction grating spectrometers are assessed in view of RIXS opportunities that lie ahead.
引用
收藏
页码：185 / 210
页数：26
相关论文
共 50 条
  • [41] Resonant inelastic scattering in dilute magnetic semiconductors by soft X-ray fluorescence spectroscopy
    LawniczakJablonska, K
    Jia, JJ
    Lin, L
    Grush, MM
    Callcott, TA
    Asfaw, A
    Carlisle, JA
    Terminello, LJ
    Himpsel, FJ
    Ederer, DL
    Underwood, JH
    Perera, RCC
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1997, 65 (02): : 173 - 177
  • [42] Resonant inelastic scattering in localized solid systems by soft x-ray fluorescence spectroscopy
    Perera, RCC
    Jia, JJ
    Callcott, TA
    Carlisle, JA
    Terminello, LT
    Himpsel, FJ
    Ederer, DL
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1996, 79 : 139 - 142
  • [43] Resonant inelastic scattering in dilute magnetic semiconductors by soft X-ray fluorescence spectroscopy
    Lawniczak-Jablonska, K.
    Jia, J.J.
    Lin, L.
    Grush, M.M.
    Callcott, T.A.
    Asfaw, A.
    Carlisle, J.A.
    Terminello, L.J.
    Himpsel, F.J.
    Ederer, D.L.
    Underwood, J.H.
    Perera, R.C.C.
    Applied Physics A: Materials Science and Processing, 1997, A 65 (02): : 173 - 177
  • [44] Resonant inelastic scattering at intermediate X-ray energies
    Hague, CF
    Mariot, JM
    Journel, L
    Gallet, JJ
    Rogalev, A
    Krill, G
    Kappler, JP
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2000, 110 (1-3) : 179 - 187
  • [45] Electronic structure of Gd hydrides studied by resonant Inelastic soft X-ray scattering
    Kvashnina, KO
    Butorin, SM
    Nordgren, J
    Guo, JH
    Hjörvarsson, B
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2004, 137 : 487 - 489
  • [46] Angular anisotropy of resonant inelastic soft x-ray scattering from liquid water
    Forsberg, Johan
    Grasjo, Johan
    Brena, Barbara
    Nordgren, Joseph
    Duda, Laurent-C.
    Rubensson, Jan-Erik
    PHYSICAL REVIEW B, 2009, 79 (13)
  • [47] Resonant inelastic soft X-ray scattering at double core excitations in solid LiCl
    Agaker, Marcus
    Kaambre, Tanel
    Glover, Chris
    Schmitt, Thorsten
    Mattesini, Maurizio
    Ahuja, Rajeev
    Soderstrom, Johan
    Rubensson, Jan-Erik
    PHYSICAL REVIEW B, 2006, 73 (24)
  • [48] Magnetic effects on the resonant inelastic soft X-ray scattering in the transition metal oxides
    Grebennikov, VI
    JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2003, 258 : 241 - 243
  • [49] Resonant inelastic soft x-ray scattering on LaPt2Si2
    John Mukkattukavil, Deepak
    Hellsvik, Johan
    Ghosh, Anirudha
    Chatzigeorgiou, Evanthia
    Nocerino, Elisabetta
    Wang, Qisi
    von Arx, Karin
    Huang, Shih-Wen
    Ekholm, Victor
    Hossain, Zakir
    Thamizhavel, Arumugum
    Chang, Johan
    Mansson, Martin
    Nordstrom, Lars
    Sathe, Conny
    Agaker, Marcus
    Rubensson, Jan-Erik
    Sassa, Yasmine
    JOURNAL OF PHYSICS-CONDENSED MATTER, 2022, 34 (32)
  • [50] Magnetic circular dichroism in soft X-ray resonant inelastic scattering: concepts and perspectives
    Braicovich, L
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2005, 144 : 695 - 699
12345