A Student's Introduction to Resonant Inelastic Soft X-ray Scattering

被引:0
|
作者
Chiuzbaian, Sorin G. [1 ,2 ]
机构
[1] Univ Paris 06, Lab Chim Phys Mat & Rayonnement, 11 Rue Pierre & Marie Curie, F-75005 Paris, France
[2] CNRS, UMR 7614, F-75005 Paris, France
关键词
ELECTRONIC-STRUCTURE; SPECTROMETER; RESOLUTION; NIO; SPECTROGRAPH; EXCITATIONS; SYSTEM;
D O I
10.1007/978-3-319-03032-6_6
中图分类号
O59 [应用物理学];
学科分类号
摘要
Recent instrumental advances have opened an important window for studying magnetic excitations with resonant inelastic x-ray scattering (RIXS). This contribution outlines the main theoretical and experimental aspects underlying this spectroscopic technique. The aspects discussed cover self-absorption corrections, scattering geometry, resonant scattering cross sections and methods for identifying and exploiting spectral information. State of the art diffraction grating spectrometers are assessed in view of RIXS opportunities that lie ahead.
引用
收藏
页码:185 / 210
页数:26
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