Computational Super-Sectioning for Single-Slice Structured-Illumination Microscopy

被引:6
|
作者
Soubies, Emmanuel [1 ]
Unser, Michael [1 ]
机构
[1] Ecole Polytech Fed Lausanne, Biomed Imaging Grp, CH-1015 Lausanne, Switzerland
基金
欧洲研究理事会;
关键词
Structured-illumination microscopy; super-resolution; reconstruction algorithms; inner-loop-free ADMM; proximal operators; PATTERNED EXCITATION MICROSCOPY; FIELD FLUORESCENCE MICROSCOPY; IMAGE-RECONSTRUCTION; LATERAL RESOLUTION; INVERSE;
D O I
10.1109/TCI.2018.2887136
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
While structured-illumination microscopy (SIM) is inherently a three-dimensional (3-D) technique, many biological questions can be addressed from the acquisition of a single focal plane with high lateral resolution. Unfortunately, the single-slice reconstruction of thick samples suffers from defocusing. In this paper, however, we take advantage of a 3-D model of the acquisition system to derive a reconstruction method out of a single two-dimensional (2-D) SIM measurement. It enables the estimation of the out-of-focus signal and improves the quality of the reconstruction, without the need of acquiring additional slices. The proposed algorithm relies on a specific formulation of the optimization problem together with the derivation of computationally efficient proximal operators. These developments allow us to deploy an efficient inner-loop-free alternating-direction method of multipliers (ADMM), with guaranteed convergence.
引用
收藏
页码:240 / 250
页数:11
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