Influence of Electrode Roughness on Stripping Voltammetry: Mathematical Modeling and Numerical Simulation

被引:22
|
作者
Menshykau, Denis [1 ]
Compton, Richard G. [1 ]
机构
[1] Univ Oxford, Phys & Theoret Chem Lab, Dept Chem, Oxford OX1 3QZ, England
来源
JOURNAL OF PHYSICAL CHEMISTRY C | 2009年 / 113卷 / 35期
关键词
DOPED-DIAMOND ELECTRODES; CARBON PASTE ELECTRODES; QUASI-REVERSIBLE PROCESSES; PLANE PYROLYTIC-GRAPHITE; ATOMIC-FORCE MICROSCOPY; MERCURY-FILM ELECTRODE; ULTRA-TRACE AMOUNTS; CYCLIC VOLTAMMETRY; FRACTAL SURFACES; ELECTROCHEMICAL DETECTION;
D O I
10.1021/jp904187t
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Electrodes with rough surfaces inevitably have practical importance from both applied and fundamental points of view including electroanalysis where stripping voltammetry is a popular technique due to its simplicity and high sensitivity. The diffusional domain approach is used to model stripping voltammetry at rough electrodes: two models of the electrode Surface, "rough" and "scratched", are considered. Electron transfer is described by three models which correspond to cases of stripping of a monolayer, a thin layer, and a bulk layer, The shape of the votammograms strongly depends on the model of the electron transfer but is not always sensitive to the precise model of the electrode surface; the conditions under which this is the case are identified, and generic roughness effects on stripping voltammetry are quantified. We conclude that electrode roughness can have a significant effect on the stripping of the metals from the solid electrode especially in respect of the voltammetric waveshape.
引用
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页码:15602 / 15620
页数:19
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