Thermal stability of proton-conducting silicophosphate materials formed by sol-gel method

被引：2
|
作者：
Remenyuk, A. D. [1 ]
Khamova, T. V. [1 ,2 ]
Nechitailov, A. A. [1 ]
Shilova, O. A. [2 ]
Tomasov, A. A. [1 ]
Trapeznikova, I. N. [1 ]
机构：
[1] Russian Acad Sci, AF Ioffe Physicotech Inst, St Petersburg 194021, Russia
[2] Russian Acad Sci, IV Grebenshchikov Silicate Chem Inst, St Petersburg 199034, Russia
来源：
RUSSIAN JOURNAL OF ELECTROCHEMISTRY | 2009年 / 45卷 / 05期
基金：
俄罗斯基础研究基金会;
关键词：
silicophosphate nanocomposites; sol-gel method; protonic conductivity; thermal analysis; IR spectroscopy; MEDIUM-TEMPERATURE RANGE; PHOSPHOSILICATE GELS; PHOSPHORIC-ACID;
D O I：
10.1134/S1023193509050218
中图分类号：
O646 [电化学、电解、磁化学];
学科分类号：
081704 ;
摘要：
This work estimated ionic conductivity and studied thermal stability of proton-conducting xerogel materials and films formed from sol-gel system based on tetraethoxysilane and orthophosphoric acid modified with H2SO4. Ionic conductivity was estimated by means of complex impedance spectroscopy. Thermal stability (temperature effect to chemical composition) of the synthesized materials was studied by means of differential thermal analysis and FTIR. Basing on the gained results, addition of H2SO4 as a modifying compound was shown to increase ionic conductivity of silicophosphate materials up to ca. 10(-2) S/cm at room temperature due to their structure formed by guest-host mechanism, where sulfate ions are retained by formed by silocophosphate sol-gel matrix.
引用
收藏
页码：609 / 614
页数：6
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