Characterization and optimization of ion implantation for high spatial resolution quantum well intermixing in GaAs/AlGaAs superlattices

被引:5
|
作者
Younis, Usman [1 ]
Holmes, Barry M. [2 ]
Hutchings, David C. [2 ]
机构
[1] Natl Univ Sci & Technol, Sch Elect Engn & Comp Sci, Dept Elect Engn, Islamabad 44000, Pakistan
[2] Univ Glasgow, Sch Engn, Glasgow G12 8QQ, Lanark, Scotland
来源
基金
英国工程与自然科学研究理事会;
关键词
FREE VACANCY DIFFUSION; WAVE-GUIDES; INTEGRATION; LASERS;
D O I
10.1051/epjap/2014140020
中图分类号
O59 [应用物理学];
学科分类号
摘要
Processes to achieve high spatial resolution ion implantation induced quantum well intermixing in GaAs/AlGaAs superlattices have been developed. Ion implantation has been carried out using various doses of 4 MeV As2+ ion beam, followed by rapid thermal annealing at various temperatures for 60 s. Low temperature photoluminescence measurements reveal a blue-shift up to 90 nm in the energy band-gap. Propagation losses have been characterized in the intermixed waveguides, and losses as low as 0.55 cm(-1) have been observed for 0.5 x 10(13) cm(-2) implantation dose which gives a blue-shift of 68 nm when annealed at 775 degrees C. The spatial resolution of similar to 1.2 mu m has been observed at the depth of 2 mu m inside the epitaxial structure.
引用
收藏
页数:5
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