Nanocrystal size distribution analysis from transmission electron microscopy images

被引：7

作者：

van Sebille, Martijn ^{[1
]}

van der Maaten, Laurens J. P. ^{[2
]}

Xie, Ling ^{[3
]}

Jarolimek, Karol ^{[1
]}

Santbergen, Rudi ^{[1
]}

van Swaaij, Rene A. C. M. M. ^{[1
]}

Leifer, Klaus ^{[3
]}

Zeman, Miro ^{[1
]}

机构：

[1] Delft Univ Technol, Photovolta Mat & Devices, NL-2628 CD Delft, Netherlands

[2] Delft Univ Technol, Pattern Recognit Lab, NL-2628 CD Delft, Netherlands

[3] Uppsala Univ, Appl Mat Sci, S-75237 Uppsala, Sweden

来源：

NANOSCALE | 2015年 / 7卷 / 48期

关键词：

TEM;

D O I：

10.1039/c5nr06292f

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

We propose a method, with minimal bias caused by user input, to quickly detect and measure the nanocrystal size distribution from transmission electron microscopy (TEM) images using a combination of Laplacian of Gaussian filters and non-maximum suppression. We demonstrate the proposed method on bright-field TEM images of an a-SiC:H sample containing embedded silicon nanocrystals with varying magnifications and we compare the accuracy and speed with size distributions obtained by manual measurements, a thresholding method and PEBBLES. Finally, we analytically consider the error induced by slicing nanocrystals during TEM sample preparation on the measured nanocrystal size distribution and formulate an equation to correct this effect.

引用

页码：20593 / 20606

页数：14

共 50 条

[31] Determination of latex particle size distribution by transmission electron microscopy (TEM) and image analysis: Standardized procedures and key factors
Li, Zhengmin
Yang, Jinghe
Wang, Ling
INTERNATIONAL JOURNAL OF POLYMER ANALYSIS AND CHARACTERIZATION, 2006, 11 (05) : 337 - 351
[32] Laser diffraction, transmission electron microscopy and image analysis to evaluate a bimodal Gaussian model for particle size distribution in soils
Pieri, Linda
Bittelli, Marco
Pisa, Paola Rossi
GEODERMA, 2006, 135 : 118 - 132
[33] Nanocrystal Diffusion in a Liquid Thin Film Observed by in Situ Transmission Electron Microscopy
Zheng, Haimei
Claridge, Shelley A.
Minor, Andrew M.
Alivisatos, A. Paul
Dahmen, Ulrich
NANO LETTERS, 2009, 9 (06) : 2460 - 2465
[34] Transmission electron microscopy measurements of the injection distances in nanocrystal-based memories
Assayag, GB
Bonafos, C
Carrada, M
Claverie, A
Normand, P
Tsoukalas, D
APPLIED PHYSICS LETTERS, 2003, 82 (02) : 200 - 202
[35] A Method to Measure Pore Size Distribution of Porous Materials Using Scanning Electron Microscopy Images
Widiatmoko, Eko
Abdullah, Mikrajuddin
Khairurrijal
THIRD NANOSCIENCE AND NANOTECHNOLOGY SYMPOSIUM 2010 - NNSB2010, 2010, 1284 : 23 - 26
[36] Particle size distribution inferred from small-angle X-ray scattering and transmission electron microscopy
Rieker, T
Hanprasopwattana, A
Datye, A
Hubbard, P
LANGMUIR, 1999, 15 (02) : 638 - 641
[37] MEASUREMENT OF VOID SIZE BY TRANSMISSION ELECTRON-MICROSCOPY
SPRAGUE, JA
SMIDT, FA
REPORT OF NRL PROGRESS, 1976, (DEC): : 26 - 29
[38] Semi-supervised machine learning workflow for analysis of nanowire morphologies from transmission electron microscopy images
Lu, Shizhao
Montz, Brian
Emrick, Todd
Jayaraman, Arthi
DIGITAL DISCOVERY, 2022, 1 (06): : 816 - 833
[39] Lattice distortion analysis directly from high resolution transmission electron microscopy images - the LADIA program package
Du, K
Rau, Y
Jin-Phillipp, NY
Phillipp, F
JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY, 2002, 18 (02) : 135 - 138
[40] Lattice Distortion Analysis Directly from High Resolution Transmission Electron Microscopy Images —the LADIA Program Package
Y.Rau
Journal of Materials Science & Technology, 2002, (02) : 135 - 138

← 1 2 3 4 5 →