Large-area MoS2 grown using H2S as the sulphur source

被引:73
|
作者
Dumcenco, Dumitru [1 ]
Ovchinnikov, Dmitry [1 ]
Sanchez, Oriol Lopez [1 ]
Gillet, Philippe [2 ]
Alexander, Duncan T. L. [3 ]
Lazar, Sorin [4 ]
Radenovic, Aleksandra [5 ]
Kis, Andras [1 ]
机构
[1] Ecole Polytech Fed Lausanne, Inst Elect Engn, CH-1015 Lausanne, Switzerland
[2] Ecole Polytech Fed Lausanne Lausanne EPFL, Inst Condensed Matter Phys, CH-1015 Lausanne, Switzerland
[3] Ecole Polytech Fed Lausanne, Interdisciplinary Ctr Elect Microscopy CIME, CH-1015 Lausanne, Switzerland
[4] FEI Elect Opt, NL-5600 KA Eindhoven, Netherlands
[5] Ecole Polytech Fed Lausanne, Inst Bioengn, CH-1015 Lausanne, Switzerland
来源
2D MATERIALS | 2015年 / 2卷 / 04期
关键词
MoS2; CVD; structural properties; VAPOR-PHASE GROWTH; MOLYBDENUM-DISULFIDE; ATOMIC LAYERS; FILMS; EXFOLIATION; TRANSITION; MORPHOLOGY; EVOLUTION;
D O I
10.1088/2053-1583/2/4/044005
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We report on the growth of molybdenum disulphide (MoS2) using H2S as a gas-phase sulfur precursor that allows controlling the domain growth direction of domains in both vertical (perpendicular to the substrate plane) and horizontal (within the substrate plane), depending on the H2S:H-2 ratio in the reaction gas mixture and temperature at which they are introduced during growth. Optical and atomic force microscopy measurements on horizontal MoS2 demonstrate the formation of monolayer triangular-shape domains that merge into a continuous film. Scanning transmission electron microscopy of monolayer MoS2 shows a regular atomic structure with a hexagonal symmetry. Raman and photoluminescence spectra confirm the monolayer thickness of the material. Field-effect transistors fabricated on MoS2 domains that are transferred onto Si/SiO2 substrates show a mobility similar to previously reported exfoliated and chemical vapor deposition-grown materials.
引用
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页数:7
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