Background-free spectroscopy of impurity transitions in semiconductors with a continuous-wave terahertz photomixer source

被引：0
|
作者：
Wienold, M. [1 ,2 ]
Pavlov, S. G. [2 ]
Abrosimov, N., V [3 ]
Huebers, H-W [1 ,2 ]
机构：
[1] German Aerosp Ctr DLR, Inst Opt Sensor Syst, Rutherfordstr 2, D-12489 Berlin, Germany
[2] Humboldt Univ, Dept Phys, Newtonstr 15, D-12489 Berlin, Germany
[3] Leibniz Inst Kristallzuchtung, Max Born Str 2, D-12489 Berlin, Germany
来源：
2019 44TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ) | 2019年
关键词：
D O I：
10.1109/irmmw-thz.2019.8873787
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We present a method for background-free spectroscopy of shallow impurity transitions in semiconductors with residual impurity concentrations. The method is based on a continuous wave terahertz photomixer source and a scheme for optically modulating the concentration of neutral impurities.
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页数：2
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