Photodetectors based on the AlGaN/GaN heterostructure suffer from persistent photoconductivity (PPC) in which recovery from the optical stimulus can take days. This behavior is unsuitable for many applications where reliable and consistent optical response is required. This letter presents a method for suppressing PPC in AlGaN/GaN photodetectors by employing device suspension and in situ heating. The highly conductive two-dimensional electron gas (2DEG) at the interface of AlGaN and GaN serves as both a sensor and a heater (via Joule heating). Microfabricated AlGaN/GaN-on-Si ultraviolet (UV) photodetectors(suspendedand unsuspended) were exposed to UV (365 nm) for 60 s and the transient responses were measured under various in situ heating conditions. The measured transient response showed a decay time of similar to 39 h when the photodetectorwas not heated and 24 s for a suspended photodetector with in situ 2DEG heating (270 degrees C with a power of 75 mW). This remarkable suppression of the PPC in AlGaN/GaN UV photodetectors can be attributed to the novel device architecture and in situ heating capability, which enables accelerationof the carrier capture rate during operation.
机构:
Key Laboratory for UV-Emitting Materials and Technology of Ministry of Education,Northeast Normal UniversityKey Laboratory for UV-Emitting Materials and Technology of Ministry of Education,Northeast Normal University
周海涛
丛璐佳
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Key Laboratory for UV-Emitting Materials and Technology of Ministry of Education,Northeast Normal UniversityKey Laboratory for UV-Emitting Materials and Technology of Ministry of Education,Northeast Normal University
丛璐佳
马剑钢
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Key Laboratory for UV-Emitting Materials and Technology of Ministry of Education,Northeast Normal UniversityKey Laboratory for UV-Emitting Materials and Technology of Ministry of Education,Northeast Normal University
马剑钢
李炳生
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Key Laboratory for UV-Emitting Materials and Technology of Ministry of Education,Northeast Normal UniversityKey Laboratory for UV-Emitting Materials and Technology of Ministry of Education,Northeast Normal University
李炳生
徐海洋
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Key Laboratory for UV-Emitting Materials and Technology of Ministry of Education,Northeast Normal UniversityKey Laboratory for UV-Emitting Materials and Technology of Ministry of Education,Northeast Normal University
徐海洋
刘益春
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Key Laboratory for UV-Emitting Materials and Technology of Ministry of Education,Northeast Normal UniversityKey Laboratory for UV-Emitting Materials and Technology of Ministry of Education,Northeast Normal University
机构:
Stanford Univ, Dept Mat Sci & Engn, 450 Jane Stanford Way, Stanford, CA 94305 USAStanford Univ, Dept Mat Sci & Engn, 450 Jane Stanford Way, Stanford, CA 94305 USA
Heuser, Thomas A.
Chapin, Caitlin A.
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Stanford Univ, Dept Aeronaut & Astronaut, 450 Jane Stanford Way, Stanford, CA 94305 USA
Lawrence Livermore Natl Lab, Livermore, CA 94550 USAStanford Univ, Dept Mat Sci & Engn, 450 Jane Stanford Way, Stanford, CA 94305 USA
Chapin, Caitlin A.
Holliday, Max A.
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Stanford Univ, Dept Mat Sci & Engn, 450 Jane Stanford Way, Stanford, CA 94305 USAStanford Univ, Dept Mat Sci & Engn, 450 Jane Stanford Way, Stanford, CA 94305 USA
Holliday, Max A.
Wang, Yongqiang
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Los Alamos Natl Lab, Mat Sci & Technol Div, Los Alamos, NM 87545 USAStanford Univ, Dept Mat Sci & Engn, 450 Jane Stanford Way, Stanford, CA 94305 USA
Wang, Yongqiang
Senesky, Debbie G.
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Stanford Univ, Dept Aeronaut & Astronaut, 450 Jane Stanford Way, Stanford, CA 94305 USA
Stanford Univ, Dept Elect Engn, 450 Jane Stanford Way, Stanford, CA 94305 USAStanford Univ, Dept Mat Sci & Engn, 450 Jane Stanford Way, Stanford, CA 94305 USA
机构:
Hanyang Univ, Dept Mech Convergence Engn, Seoul 04763, South KoreaHanyang Univ, Dept Mech Convergence Engn, Seoul 04763, South Korea
Shin, Sanghun
So, Hongyun
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Hanyang Univ, Dept Mech Convergence Engn, Seoul 04763, South Korea
Hanyang Univ, Inst Nano Sci & Technol, Seoul 04763, South KoreaHanyang Univ, Dept Mech Convergence Engn, Seoul 04763, South Korea