Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles

被引：122
|
作者：
Berden, G
Jamison, SP
MacLeod, AM
Gillespie, WA
Redlich, B
van der Meer, AFG
机构：
[1] EURATOM, FOM, Inst Plasma Phys Rijnhuizen, NL-3439 MN Nieuwegein, Netherlands
[2] Univ Abertay Dundee, Sch Comp & Adv Technol, Dundee DD1 1HG, Scotland
来源：
PHYSICAL REVIEW LETTERS | 2004年 / 93卷 / 11期
基金：
英国工程与自然科学研究理事会;
关键词：
D O I：
10.1103/PhysRevLett.93.114802
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
Electro-optic detection of the Coulomb field of a relativistic electron bunch combined with single-shot cross correlation of optical pulses is used to enable single-shot measurements of the shape and length of femtosecond electron bunches. This method overcomes a fundamental time-resolution limit of previous single-shot electro-optic measurements, which arises from the inseparability of time and frequency properties of the probing optical pulse. Using this new technique we have made real-time measurements of a 50 MeV electron bunch, observing the profile of 650 fs FWHM (similar to275 fs rms) long bunches.
引用
收藏
页码：114802 / 1
页数：4
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