Applications of FT-IR microscopy with materials analyses

被引：12
|
作者：
Wilhelm, P [1 ]
机构：
[1] ZENTRUM ELEKTRONENMIKROSKOPIE GRAZ,A-8010 GRAZ,AUSTRIA
来源：
MICRON | 1996年 / 27卷 / 05期
关键词：
infrared spectroscopy; FT-IR microscopy; attenuated total reflectance; materials analyses; polymers; rubber;
D O I：
10.1016/S0968-4328(96)00020-0
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
Some applications of FT-IR microscopy in materials analyses are reported. IR spectra were taken in transmission, using a sample compression cell, or in ATR mode, using an ATR objective for the infrared microscope. Defects and inclusions in polymers and rubbers were chemically characterized. Limitations of the method are discussed, and the importance of sample preparation and proper selection of the infrared spectral technique for intractable samples is emphasized. Copyright (C) 1996 Elsevier Science Ltd
引用
收藏
页码：341 / 344
页数：4
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