Index of refraction from the near-ultraviolet to the near-infrared from a single crystal microwave-assisted CVD diamond

被引：24

作者：

Turri, Giorgio ^{[1
,2
]}

Webster, Scott ^{[1
]}

Chen, Ying ^{[1
]}

Wickham, Benjamin ^{[3
]}

Bennett, Andrew ^{[3
]}

Bass, Michael ^{[1
]}

机构：

[1] Univ Cent Florida, Coll Opt & Photon, CREOL, Orlando, FL 32816 USA

[2] Embry Riddle Aeronaut Univ, Dept Pys Sci, Daytona Beach, FL 32114 USA

[3] Element Six Ltd, Global Innovat Ctr, Fermi Ave, Harwell OX11 0QR, Berks, England

来源：

OPTICAL MATERIALS EXPRESS | 2017年 / 7卷 / 03期

关键词：

CONSTANTS;

D O I：

10.1364/OME.7.000855

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The refractive index of a type IIa CVD-grown single-crystal diamond was measured by ellipsometry from the near ultraviolet to the near infrared region of the spectrum. As a consequence, a one term Sellmeier Equation with coefficents of B-1 = 4.658 and C-1 = 112.5 for the refractive index of diamond, for the wavelength range from 300 to 1650 nm, was derived that is only as accurate as the input data, +/- 0.002. The experimental results in this paper between 800 and 1650 nm are new, adding to the values available in the literature. (C) 2017 Optical Society of America

引用

页码：855 / 859

页数：5

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