Phase dependence of the Josephson current in inhomogeneous high-Tc grain-boundary junctions

被引：40
|
作者：
Il'ichev, E
Zakosarenko, V
Ijsselsteijn, RPJ
Hoenig, HE
Meyer, HG
Fistul, MV
Müller, P
机构：
[1] Inst Phys High Technol, Dept Cryoelect, D-07702 Jena, Germany
[2] Univ Erlangen Nurnberg, Inst Phys 3, D-91058 Erlangen, Germany
来源：
PHYSICAL REVIEW B | 1999年 / 59卷 / 17期
关键词：
D O I：
10.1103/PhysRevB.59.11502
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We present an experimental and theoretical study of the current-phase relation I-s(phi) for 45 degrees grain boundaries in YBa2Cu3O7-x films. A model of strongly inhomogeneous Josephson junctions, in which the presence of randomly alternating current leads to a deviation of I-s(phi) from the well-known sin(phi) dependence, has been used. This deviation decreases with the temperature T and is described by the formula I-s(phi) = I-c(T)(sin phi + gamma(T)sin2 phi). Using the developed model, the coefficient gamma is calculated and its temperature dependence is found to be in good agreement with experiment. [S0163-1829(99)01417-4].
引用
收藏
页码：11502 / 11505
页数：4
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