Dielectric relaxation in Bi12SiO20:Cr crystals

被引：7

作者：

Panchenko, TV ^{[1
]}

Karpova, LM ^{[1
]}

Duda, VM ^{[1
]}

机构：

[1] Dnepropetrovsk State Univ, UA-320625 Dnepropetrovsk 10, Ukraine

来源：

PHYSICS OF THE SOLID STATE | 2000年 / 42卷 / 04期

关键词：

Spectroscopy; State Physics; Frequency Dependence; Dielectric Relaxation; Lattice Distortion;

D O I：

10.1134/1.1131271

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

A study is reported of the temperature and frequency dependences of the permittivity and losses in Cr-doped Bi12SiO20 crystals at sonic frequencies and in the range 300-800 K. A number of dielectric anomalies and a close-to-linear Cole-Cole diagram have been observed. The results are discussed by invoking the concepts of electron hopping and screening of the induced polarization through the relaxation of local lattice distortions. (C) 2000 MAIK "Nauka/Interperiodica".

引用

页码：689 / 693

页数：5

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