Calibrating an optical scanner for quality assurance of large area radiation detectors

被引:2
|
作者
Karadzhinova, A. [1 ]
Hilden, T. [1 ,2 ]
Berdova, M. [3 ,4 ]
Lauhakangas, R. [1 ]
Heino, J. [1 ]
Tuominen, E. [1 ]
Franssila, S. [3 ,4 ]
Haeggstrom, E. [2 ]
Kassamakov, I. [1 ,2 ]
机构
[1] Aalto Univ, Helsinki Inst Phys, Detector Lab, POB 64, FI-00014 Helsinki, Finland
[2] Univ Helsinki, Dept Phys, FI-00014 Helsinki, Finland
[3] Aalto Univ, Dept Mat Sci & Engn, FI-0076 Espoo, Finland
[4] Micronova Nanofabricat Ctr, FI-0076 Espoo, Finland
关键词
calibration; optical; transfer standard; expanded uncertainty; GEM; AMPLIFICATION;
D O I
10.1088/0957-0233/25/11/115403
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A gas electron multiplier (GEM) is a particle detector used in high-energy physics. Its main component is a thin copper-polymer-copper sandwich that carries empty set = 70 +/- 5 mu m holes. Quality assurance (QA) is needed to guarantee both long operating life and reading fidelity of the GEM. Absence of layer defects and conformity of the holes to specifications is important. Both hole size and shape influence the detector's gas multiplication factor and hence affect the collected data. For the scanner the required lateral measurement tolerance is +/- 5 mu m. We calibrated a high aspect ratio optical scanning system (OSS) to allow ensuring the quality of large GEM foils. For the calibration we microfabricated transfer standards, which were imaged with the OSS and which were compared to corresponding scanning electron microscopy (SEM) images. The calibration fulfilled the ISO/IEC 17025 and UKAS M3003 requirements: the calibration factor was 1.01 +/- 0.01, determined at 95% confidence level across a 950 x 950 mm(2) area. The proposed large-scale scanning technique can potentially be valuable in other microfabricated products too.
引用
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页数:11
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