Thermal interface material resistance measurement apparatus

被引：0
|
作者：
Badoni, Stuti Shekher [1 ]
Rhee, Jinny [1 ]
机构：
[1] San Jose State Univ, 1 Washington Sq, San Jose, CA 95192 USA
来源：
IEEE CPMT: INTERNATIONAL SYMPOSIUM AND EXHIBITION ON ADVANCED PACKAGING MATERIALS: PROCESSES, PROPERTIES AND INTERFACES | 2006年
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：157 / 157
页数：1
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