Electrochemical quartz crystal microbalance studies of the passive behavior of Cr in a sulfuric acid solution

被引：31
|
作者：
Olsson, COA [1 ]
Hamm, D [1 ]
Landolt, D [1 ]
机构：
[1] Ecole Polytech Fed Lausanne, Dept Mat, Lab Met Chim, CH-1015 Lausanne, Switzerland
来源：
JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 2000年 / 147卷 / 07期
关键词：
D O I：
10.1149/1.1393569
中图分类号：
O646 [电化学、电解、磁化学];
学科分类号：
081704 ;
摘要：
Properties of passive films on Cr were studied in situ using the electrochemical quartz crystal microbalance (EQCM). Potential sweeps were performed from the low to the high passive region. From these measurements, it is shown how to calculate a time-resolved fraction of the film growth current and a thickness change. The film thickness change estimated with EQCM matched well with X-ray photoelectron spectroscopy measurements. During the potential sweep experiments, it was observed that the current reached a steady-state value proportional to the scan rate. It is suggested that this proportionality can be used to determine the electric field within the Rim. (C) 2000 The Electrochemical Society. S0013-4651(00)01-105-8. All rights reserved.
引用
收藏
页码：2563 / 2571
页数：9
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