A Simulation Study for Determination of Refractive Index Dispersion of Dielectric Film from Reflectance Spectrum by Using Paul Wavelet

被引：1

作者：

Tiryaki, Erhan ^{[1
]}

Coskun, Emre ^{[1
]}

Kocahan, Ozlem ^{[2
]}

Ozder, Serhat ^{[1
]}

机构：

[1] Canakkale Onsekiz Mart Univ, Dept Phys, Canakkale, Turkey

[2] Namik Kemal Univ, Dept Phys, Tekirdag, Turkey

来源：

PROCEEDINGS OF THE TURKISH PHYSICAL SOCIETY 32ND INTERNATIONAL PHYSICS CONGRESS (TPS32) | 2017年 / 1815卷

关键词：

OPTICAL-CONSTANTS; THICKNESS;

D O I：

10.1063/1.4976392

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

In this work, the Continuous Wavelet Transform (CWT) with Paul wavelet was improved as a tool for determination of refractive index dispersion of dielectric film by using the reflectance spectrum of the film The reflectance spectrum was generated theoretically in the range of 0.8333 - 3.3333 mu m wavenumber and it was analyzed with presented method. Obtained refractive index determined from various resolution of Paul wavelet were compared with the input values, and the importance of the tunable resolution with Paul wavelet was discussed briefly. The noise immunity and uncertainty of the method was also studied.

引用

页数：4

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