Defects of the crystal structure of Hg1-xCdxTe thin layer grown by pulsed laser deposition

Thin solid films of Hg1-xCdxTe on KCl substrate have been obtained by pulse laser deposition (PLD). The crystal structure of the films obtained has been investigated using electron diffraction methods (TED). The texture crystal structure of the films exhibits two inequivalent orientations of grains in the plane of the substrate. Electron diffraction patterns show on the plane defects of the layers caused by {1 1 1}-twinning. Under the right conditions such defects may lead to the growth of nanostructural grains. (C) 2003 Elsevier B.V. All rights reserved.