High-Thermal-Stability White Light-Emitting-Diodes Employing Broadband Glass Phosphor

被引:1
|
作者
Cheng, Wood-Hi [1 ]
Chen, Li-Yin [1 ]
Cheng, Wei-Chih [1 ]
机构
[1] Natl Sun Yat Sen Univ, Dept Photon, Kaohsiung 80424, Taiwan
关键词
D O I
10.1117/12.2065510
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report the high-thermal-stability white light-emitting-diodes (WLEDs) employing broadband glass phosphors. The broadband glass phosphors were fabricated by sintering the mixture of multiple phosphors and SiO2-based glass (SiO2-Na2O-Al2O3-CaO) at 680 degrees C. Y3Al5O12:Ce3+ (YAG), Lu3Al5O12:Ce3+ (LuAG), and CaAlSiN3: Eu2+ (Nitride) phosphor crystals were chosen as the yellow, green, and red emitters of the glass phosphors, respectively. The results showed that the broadband phosphors exhibited high quantum-yield of 54% and color-rendering index (CRI) of 90. The lumen degradation, chromaticity shift, and transmittance loss in the broadband glass-based WLEDs under thermal aging temperature at 150, 250, 350 and 450 degrees C. were also presented and compared with those of silicone-based WLEDs under thermal aging temperature at 150 and 250 degrees C. The results demonstrated that the broadband glass-based WLEDs exhibited better thermal stability in lumen degradation, chromaticity shift, and transmittance loss than the silicone-based WLEDs. The excellent thermal stability of the broadband glass-based WLEDs with high CRI is essentially beneficial to the applications for next-generation solid-state indoor lighting, especially in the area where high power and absolute reliability are required.
引用
收藏
页数:10
相关论文
共 50 条
  • [11] Influence of blue-light polarization on light scattering in nanocrystal luminescent glass for white light-emitting-diodes
    Li H.-G.
    Zhang Y.-T.
    Zhong D.
    Xu S.-C.
    Fei Q.-N.
    Wang D.-J.
    Optoelectronics Letters, 2010, 6 (03) : 164 - 167
  • [12] A novel red phosphor for white light emitting diodes
    Hu, YS
    Zhuang, WD
    Ye, HQ
    Wang, DH
    Zhang, SS
    Huang, XW
    JOURNAL OF ALLOYS AND COMPOUNDS, 2005, 390 (1-2) : 226 - 229
  • [13] Phosphor thermometry in white light-emitting diodes
    Vitta, Pranciskus
    Pobedinskas, Paulius
    Zukauskas, Arturas
    IEEE PHOTONICS TECHNOLOGY LETTERS, 2007, 19 (5-8) : 399 - 401
  • [14] A novel yellow phosphor for white light emitting diodes
    王志军
    李盼来
    杨志平
    郭庆林
    李旭
    Chinese Physics B, 2010, (01) : 515 - 519
  • [15] A novel yellow phosphor for white light emitting diodes
    Wang Zhi-Jun
    Li Pan-Lai
    Yang Zhi-Ping
    Guo Qing-Lin
    Li Xu
    CHINESE PHYSICS B, 2010, 19 (01)
  • [16] High-Temperature (350°C) Glass Phosphor Layer for Converted White Light-Emitting Diodes
    Cheng, Wood-Hi
    Tsai, Chun-Chin
    Cheng, Wei-Chih
    Chang, Jin-Kai
    Chen, Ji-Hung
    Hu, Si-Sheng
    Chen, Li-Yin
    Lin, Min-Ching
    Pan, Ching-Jen
    TWELFTH INTERNATIONAL CONFERENCE ON SOLID STATE LIGHTING AND FOURTH INTERNATIONAL CONFERENCE ON WHITE LEDS AND SOLID STATE LIGHTING, 2012, 8484
  • [17] GALLIUM-ARSENIDE LIGHT-EMITTING-DIODES WITH AN ANTI-STOKES PHOSPHOR
    KOVALENKO, VF
    LISENKER, BS
    LISOVENKO, VD
    MARONCHUK, IE
    MARONCHUK, YE
    SOVIET PHYSICS SEMICONDUCTORS-USSR, 1978, 12 (02): : 148 - 151
  • [18] Thermal-Stability Comparison of Glass- and Silicone-Based High-Power Phosphor-Converted White-Light-Emitting Diodes Under Thermal Aging
    Tsai, Chun-Chin
    Cheng, Wei-Chih
    Chang, Jin-Kai
    Huang, Shun-Yuan
    Liou, Jyun-Sian
    Chen, Gi-Hung
    Huang, Yi-Chung
    Wang, Jau-Sheng
    Cheng, Wood-Hi
    IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2014, 14 (01) : 4 - 8
  • [19] EMISSION STABILITY OF GALLIUM-PHOSPHIDE LIGHT-EMITTING-DIODES
    SHEMYAKIN, VA
    ROMANOV, AN
    FINOGENOV, AD
    TARABUKIN, NN
    PROKHORENKO, NS
    KUZOVAYA, VL
    SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1983, 50 (05): : 311 - 314
  • [20] HIGH-BRIGHTNESS GREEN LIGHT-EMITTING-DIODES
    EASON, DB
    HUGHES, WC
    REN, J
    RIEGNER, M
    YU, Z
    COOK, JW
    SCHETZINA, JF
    CANTWELL, G
    HARSCH, WC
    ELECTRONICS LETTERS, 1994, 30 (14) : 1178 - 1180