CCD technology

被引：18
|
作者：
Burke, Barry [1 ]
Jorden, Paul [1 ]
Vu, Paul [1 ]
机构：
[1] MIT, Lincoln Lab, Lexington, MA 02173 USA
来源：
EXPERIMENTAL ASTRONOMY | 2005年 / 19卷 / 1-3期
关键词：
blooming; charge-coupled device; CMOS; dark current; depletion; electronic shutter; focal-plane array; hybrid sensor; modulation transfer function; noise; orthogonal-transfer array; packages; point spread function; quantum efficiency; radiation tolerance;
D O I：
10.1007/s10686-005-9011-4
中图分类号：
P1 [天文学];
学科分类号：
0704 ;
摘要：
Charge-coupled devices (CCDs) continue to reign supreme in the realm of imaging out to 1 mu m, with the steady improvement of performance and the introduction of innovative features. This review is a survey of recent developments in the technology and the current limits on performance. Device packaging for large, tiled focal-plane arrays is also described. Comparisons between CCDs and the emerging CMOS imagers are highlighted in terms of process technology and performance.
引用
收藏
页码：69 / 102
页数：34
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