Evolution of coercivity and its angular dependence in CoFe nanostructures subjected to field cooling

被引：0
|
作者：
Rajan, G. K. [1 ]
Ramaswamy, S. [1 ,3 ]
Chandrasekharan, G. [1 ]
Thiruvadigal, D. J. [2 ]
机构：
[1] SRM Univ, Nanotechnol Res Ctr, Kattankolathur 603203, Tamil Nadu, India
[2] SRM Univ, Dept Phys & Nanotechnol, Kattankolathur 603203, Tamil Nadu, India
[3] Univ Western Australia, Sch Phys, Crawley, WA 6009, Australia
来源：
SURFACE AND INTERFACE ANALYSIS | 2014年 / 46卷 / 02期
关键词：
CoFe; thin film; nanostructures; angular dependence; coercivity; field cooling; AFM; VSM; MFM; SEM; MAGNETIZATION REVERSAL; FORCE;
D O I：
10.1002/sia.5356
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Evolution of coercivity and its angular dependence in CoFe nanostructures subjected to field cooling has been investigated in this work. Spherical CoFe grains with an average diameter of 30nm were grown on a silicon substrate using electron beam evaporation. Further, the as-deposited sample was subjected to field cooling. The morphology and topography of the sample before and after field cooling were characterized by atomic force microscopy and SEM. Magnetic force microscopy indicated that there is a good uniformity of magnetization throughout the sample after field cooling. Vibrating sample magnetometer measurements indicate that the coercivity in CoFe nanostructures is dependent on shape of the nanostructures. Copyright (c) 2013 John Wiley & Sons, Ltd.
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页码：98 / 101
页数：4
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