GRAZING-INCIDENCE SMALL-ANGLE X-RAY SCATTERING (GISAXS) FOR STUDYING SUPERLATTICES IN OPTOELECTRONIC DEVICES

被引：0
|
作者：
Boiko, M. E. [1 ]
机构：
[1] RAS, IOFFE Phys Techn Inst, St Petersburg, Russia
来源：
10TH EUROPEAN CONFERENCE ON NON-DESTRUCTIVE TESTING 2010 (ECNDT), VOLS 1-5 | 2010年
关键词：
D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
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页码：1256 / 1256
页数：1
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