Tracer diffusion in thin polystyrene films

被引:35
|
作者
Tseng, KC [1 ]
Turro, NJ [1 ]
Durning, CJ [1 ]
机构
[1] Columbia Univ, Dept Chem Engn & Appl Chem, New York, NY 10027 USA
基金
美国国家科学基金会;
关键词
polymer thin films; tracer diffusion; free volume theory;
D O I
10.1016/S0032-3861(99)00730-2
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
In order to determine how confinement of a polymer melt alters segmental scale mobility, we used fluorescence recovery after photobleaching (FRAP) to measure tracer diffusion coefficients, D, of a low molecular weight fluorescent probe in supported polystyrene (PS) thin films. The effect of film thickness was investigated for a polydisperse polymer over the range similar or equal to 10(2) - 10(4) Angstrom at conditions above the bulk glass transition temperature, T-g. For relatively thick films (thicknesses similar or equal to 1 mu m), the D agree with bulk values reported in the literature. As the film thickness decreases below similar or equal to 10(3) Angstrom, the D increase significantly, by as much as two orders of magnitude. At the same time the temperature dependence of D becomes much weaker. Analysis by free volume theory shows the data are consistent with both the effective T-g and liquid state thermal expansion coefficient, alpha, decreasing with film thickness. This agrees qualitatively with a number of recent thermal property studies on thin PS films which suggest that changes in local packing near the free surface significantly enhance the average segmental scale mobility in sufficiently thin films. (C) 2000 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:4751 / 4755
页数:5
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