Reliability of tape automated bonding using Au-Sn alloy

被引:2
|
作者
Shibata, S
Kimura, M
机构
[1] Oki Electric Industry Co., Ltd., Hachioji
关键词
TAB; bump; finger; inner lead bonding; outer lead bonding;
D O I
10.1002/ecjb.4420790807
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
When too much bonding pressure is applied in inner lead bonding, the bonding characteristic of a finger in contact with a bonding tool edge tends to degrade. When bonding pressure exceeds 21.0 kg/mm(2), the finger penetrates a bump, causing damage in the AL pad. The size of the finger is much larger than that of the solder bump. However, if the bonding condition is appropriate, the bonded section is reliable. Adhesive thermal resistance for securing Cu fingers on the TAB tape determines the upper limit of inner lead-bonding temperature. The alloy is formed during bonding operation. The alloy formation is not sufficient at 380 degrees C, but it is sufficient at 500 degrees C. In outer lead bonding, bonding pressure should be controlled to prevent the substrate surface from cracking. Increasing pad length and width and reducing the temperature difference between the bonding tool and test piece were effective in preventing cracks. In both inner lead and outer lead bonding, the damage of fingers, separation of the bump from the pad, and substrate surface cracking must be taken into account in addition to the properties of the bonded area.
引用
收藏
页码:57 / 63
页数:7
相关论文
共 50 条
  • [31] Au-Sn SLID Bonding: A Reliable HT Interconnect and Die Attach Technology
    Torleif André Tollefsen
    Andreas Larsson
    Maaike Margrete Visser Taklo
    Antonia Neels
    Xavier Maeder
    Kristin Høydalsvik
    Dag W. Breiby
    Knut Aasmundtveit
    Metallurgical and Materials Transactions B, 2013, 44 : 406 - 413
  • [32] Alloy phase formation in nanometer-sized Au-Sn particles
    Mori, H
    Yasuda, H
    SCRIPTA MATERIALIA, 2001, 44 (8-9) : 1987 - 1991
  • [33] X-RAY PHOTOEMISSION STUDY OF LIQUID AU-SN ALLOY
    ICHIKAWA, T
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1975, 32 (02): : 369 - 378
  • [34] Laser-induced alloy nanoparticles on Au-Sn thin layers
    Dzienny, P.
    Szczesny, R.
    Rerek, T.
    Trzcinski, M.
    Skowronski, L.
    Antonczak, A.
    APPLIED SURFACE SCIENCE, 2022, 591
  • [35] Continuous Strip Casting, Microstructure and Properties of Au-Sn Soldering Alloy
    Lee, Kee-Ahn
    Jin, Young-Min
    Sohn, Yong-ho
    Namkung, Jung
    Kim, Mun-Chul
    METALS AND MATERIALS INTERNATIONAL, 2011, 17 (01) : 7 - 14
  • [36] Laser-induced alloy nanoparticles on Au-Sn thin layers
    Dzienny, P.
    Szczęsny, R.
    Rerek, T.
    Trzciński, M.
    Skowroński, L.
    Antończak, A.
    Applied Surface Science, 2022, 591
  • [37] Continuous strip casting, microstructure and properties of Au-Sn soldering alloy
    Kee-Ahn Lee
    Young-Min Jin
    Yong-ho Sohn
    Jung Namkung
    Mun-Chul Kim
    Metals and Materials International, 2011, 17 : 7 - 14
  • [38] Au-Sn Transient Liquid Phase Bonding for Hermetic Sealing and Getter Activation
    Giudice, S.
    Bosshard, Ch.
    2013 EUROPEAN MICROELECTRONICS PACKAGING CONFERENCE (EMPC), 2013,
  • [39] High Temperature Interconnect and Die Attach Technology: Au-Sn SLID Bonding
    Tollefsen, Torleif Andre
    Larsson, Andreas
    Lovvik, Ole Martin
    Aasmundtveit, Knut E.
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2013, 3 (06): : 904 - 914
  • [40] HIGHLY RELIABLE AU-SN EUTECTIC BONDING WITH BACKGROUND GAAS LSI CHIPS
    NISHIGUCHI, M
    GOTO, N
    NISHIZAWA, H
    IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY, 1991, 14 (03): : 523 - 528