Detection of the single electron tunneling noise using Coulomb blockade electrometer

被引：1

作者：

Zorin, AB ^{[1
]}

Krupenin, VA ^{[1
]}

Lotkhov, SV ^{[1
]}

Niemeyer, J ^{[1
]}

Presnov, DE ^{[1
]}

Scherer, H ^{[1
]}

Wolf, H ^{[1
]}

Ahlers, FJ ^{[1
]}

Weiman, T ^{[1
]}

机构：

[1] MOSCOW MV LOMONOSOV STATE UNIV,CRYOELECTR LAB,MOSCOW 119899,RUSSIA

来源：

CZECHOSLOVAK JOURNAL OF PHYSICS | 1996年 / 46卷

关键词：

D O I：

10.1007/BF02571132

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We have studied the effect of charge fluctuations in the ultrasmall metallic island, associated with quasi-random discrete electron tunneling, on a capacitively coupled Single Electron Tunneling (SET) device. Theory can explain the experiment where the SET transistor experiences the shot noise in an inner island of the multi-junction chain.

引用

页码：2281 / 2282

页数：2

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