A Simple Deflectometric Method for Measurement of Quasi-Plane Specular Surfaces

被引:0
|
作者
Maestro-Watson, Daniel [1 ]
Izaguirre, Alberto [1 ]
Arana-Arexolaleiba, Nestor [1 ]
Iturrospe, Aitzol [1 ]
机构
[1] Mondragon Univ, Dept Elect & Comp Sci, Arrasate Mondragon 20500, Spain
来源
2015 IEEE INTERNATIONAL WORKSHOP OF ELECTRONICS, CONTROL, MEASUREMENT, SIGNALS AND THEIR APPLICATION TO MECHATRONICS (ECMSM) | 2015年
关键词
PHASE-MEASURING DEFLECTOMETRY; SHAPE;
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Deflectometric methods have been extensively used, both in research and industry, to measure the shape of specular surfaces. The method presented in this paper makes it possible to evaluate the planarity of quasi-flat surfaces, i.e. to measure angular deviations between the average normal vector of the surface and the actual vector at each point of the surface (vector field errors). The method is based on homographies, a mathematical tool that has been widely tested in computer vision. Furthermore it is simple, computationally efficient and robust. Besides that, the proposed system does not require precise positioning of the measured part. The system requires only a single camera and an LCD screen, so it is a low cost solution. Simulations have been performed to validate the system, having obtained errors on the measured vector field that are in the order of less than 1 mrad, suitable for many applications. This is a work in progress and further experiments need to be carried out and several extensions could be considered.
引用
收藏
页数:6
相关论文
共 50 条
  • [21] RADIATION AND KINETIC-PROPERTIES OF QUASI-PLANE MULTIDIMENSIONAL DOMAIN-WALLS
    TSUKANOV, VD
    JOURNAL OF PHYSICS A-MATHEMATICAL AND GENERAL, 1994, 27 (09): : 3129 - 3137
  • [22] MEASUREMENT OF SPECULAR DEFECTS ON SEMICONDUCTOR SURFACES
    ADLEY, JM
    GOREY, EF
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1970, 117 (07) : 971 - &
  • [23] Topography measurement of specular and diffuse surfaces
    Serrano Garcia, David Ignacio
    Martinez Garcia, Amalia
    Antonio Rayas-Alvarez, Juan
    REFLECTION, SCATTERING, AND DIFFRACTION FROM SURFACES II, 2010, 7792
  • [24] Iteration of B-spline surface based deflectometric method for discontinuous specular surface
    Liu, Cheng
    Gao, Nan
    Meng, Zhaozong
    Zhang, Zonghua
    Gao, Feng
    OPTICS AND LASERS IN ENGINEERING, 2023, 165
  • [25] Reflection and transmission of quasi-plane waves at the interface of piezoelectric semiconductors with initial stresses
    S.A.SAHU
    S.NIRWAL
    S.MONDAL
    Applied Mathematics and Mechanics(English Edition), 2021, 42 (07) : 951 - 968
  • [26] Dynamic potentials and Green's functions of a quasi-plane piezoelectric medium with inclusion
    Michelitsch, TM
    Levin, VM
    Gao, HJ
    PROCEEDINGS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 2002, 458 (2026): : 2393 - 2415
  • [27] Instant and averaged energy flows in the fields formed by superposition of quasi-plane waves
    Bodyanchuk, I
    Mokhun, I
    Val, O.
    Galushko, K.
    FOURTEENTH INTERNATIONAL CONFERENCE ON CORRELATION OPTICS, 2020, 11369
  • [28] THE INTERNAL DOSE-RATE OF A QUASI-PLANE ALPHA SOURCE IN WATER AND TISSUE
    HINZPETER, A
    STEINGROBE, AH
    ATOMKERNENERGIE-KERNTECHNIK, 1981, 37 (03): : 208 - 212
  • [29] A modified multi-exposure fusion method for laser measurement of specular surfaces
    An, Huijun
    Kong, Lingbao
    Xu, Min
    Song, Huixin
    Xu, Xialiang
    OPTICS COMMUNICATIONS, 2023, 545
  • [30] Deflectometric method for the measurement of user power for ophthalmic lenses
    Vargas, Javier
    Gomez-Pedrero, Jose A.
    Alonso, Jose
    Quiroga, Juan A.
    APPLIED OPTICS, 2010, 49 (27) : 5125 - 5132