Quantitative Phase Microscopy by Multi-wavelength Phase-Shifting Interference Microscopy

被引：0
|
作者：
Warnasooriya, N. [1 ]
Kim, M. K. [1 ]
机构：
[1] Univ S Florida, Dept Phys, Tampa, FL 33620 USA
来源：
2007 CONFERENCE ON LASERS & ELECTRO-OPTICS/QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE (CLEO/QELS 2007), VOLS 1-5 | 2007年
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The phase-shifting interference microscopy is combined with the multi-wavelength optical phase unwrapping to obtain quantitative phase profiles of microscopic objects without 2 pi discontinuities. Due to broadband light sources, images are less affected by coherent noise. (C) 2007 Optical Society of America
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页码：691 / 692
页数：2
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