Quantitative Phase Microscopy by Multi-wavelength Phase-Shifting Interference Microscopy

被引：0
|
作者：
Warnasooriya, N. [1 ]
Kim, M. K. [1 ]
机构：
[1] Univ S Florida, Dept Phys, Tampa, FL 33620 USA
来源：
2007 CONFERENCE ON LASERS & ELECTRO-OPTICS/QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE (CLEO/QELS 2007), VOLS 1-5 | 2007年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The phase-shifting interference microscopy is combined with the multi-wavelength optical phase unwrapping to obtain quantitative phase profiles of microscopic objects without 2 pi discontinuities. Due to broadband light sources, images are less affected by coherent noise. (C) 2007 Optical Society of America
引用
收藏
页码：691 / 692
页数：2
相关论文
共 50 条
  • [1] Multi-wavelength phase imaging interference microscopy
    Warnasooriya, Nilanthi
    Kim, Myung K.
    THREE-DIMENSIONAL AND MULTIDIMENSIONAL MICROSCOPY: IMAGE ACQUISITION AND PROCESSING XIII, 2006, 6090
  • [2] Review on Multi-Wavelength Quantitative Phase Microscopy
    Tayebi, Behnam
    Kim, Ji-hyun
    Han, Jae-Ho
    2016 4TH INTERNATIONAL WINTER CONFERENCE ON BRAIN-COMPUTER INTERFACE (BCI), 2016,
  • [3] Phase-shifting multi-wavelength dynamic interferometer
    North-Morris, MB
    Millerd, JE
    Brock, NJ
    Hayes, JB
    INTERFEROMETRY XII: TECHNIQUES AND ANALYSIS, 2004, 5531 : 64 - 75
  • [4] Phase-shifting Zernike phase contrast microscopy for quantitative phase measurement
    Gao, Peng
    Yao, Baoli
    Harder, Irina
    Lindlein, Norbert
    Torcal-Milla, Francisco Jose
    OPTICS LETTERS, 2011, 36 (21) : 4305 - 4307
  • [5] LED-based multi-wavelength phase imaging interference microscopy
    Warnasooriya, N.
    Kim, M. K.
    OPTICS EXPRESS, 2007, 15 (15): : 9239 - 9247
  • [6] Frequency domain phase retrieval of simultaneous multi-wavelength phase-shifting interferometry
    Yin, Zhenxing
    Zhong, Liyun
    Xu, Xiaofei
    Zhang, Wangping
    Tian, Jindong
    Lu, Xiaoxu
    JOURNAL OF OPTICS, 2016, 18 (05)
  • [7] Geometric phase-shifting for low-coherence interference microscopy
    Roy, M
    Svahn, P
    Cherel, L
    Sheppard, CJR
    OPTICS AND LASERS IN ENGINEERING, 2002, 37 (06) : 631 - 641
  • [8] Phase-shifting interference microscopy using a Fresnel's biprism
    Chen, J
    Endo, J
    Niino, Y
    Fujita, H
    OPTICAL ENGINEERING FOR SENSING AND NANOTECHNOLOGY (ICOSN 2001), 2001, 4416 : 158 - 161
  • [9] Multi-wavelength phase-shifting interferometry based on a two-step phase-shifting phase retrieval algorithm with a color CMOS
    Fan, Jinping
    Li, Chunjun
    Zhang, Jingdan
    Cui, Yingjie
    JOURNAL OF OPTICS, 2020, 22 (07)
  • [10] Multi-wavelength phase-shifting interferometry based on a two-step phase-shifting phase retrieval algorithm with a color CMOS
    Fan, Jinping
    Li, Chunjun
    Zhang, Jingdan
    Cui, Yingjie
    Journal of Optics (United Kingdom), 2020, 22 (07):
12345