Near-field microscopies in the study of glass

被引:7
|
作者
Zarzycki, J
机构
[1] Lab. of Sci. of Vitreous Materials, University of Montpellier II, Montpellier
关键词
D O I
10.1016/0022-3093(95)00550-1
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The introduction in the seventies of various surface spectrometries radically transformed the study of the surface of glass. These methods, based on the emission of particles under bombardment by probing beams, are composition sensitive with varied in-depth resolution but, even when combined with the scanning electron microscope, give only limited information on the local structure of the superficial layers. The invention of the scanning tunneling microscope, followed by the atomic force microscope in the early nineties, permitted for the first time three-dimensional structure of surfaces to be obtained at an atomic level. The development of a variety of sensors (optical, ionic, thermal, magnetic, etc.) further increased the scope of these 'local-probe' or 'near-field' microscopies. These new powerful techniques are currently applied to many problems in surface chemistry, physics and biology but, strangely enough, up to now, very few studies have been made on the surface of glass.
引用
收藏
页码:7 / 15
页数:9
相关论文
共 50 条
  • [21] Near-field scanning optical microscopy based nanostructuring of glass
    Chimmalgi, A.
    Hwang, D. J.
    Grigoropoulos, C. P.
    COLA'05: 8TH INTERNATIONAL CONFERENCE ON LASER ABLATION, 2007, 59 : 285 - +
  • [22] Numerical investigation of glass windows under near-field blast
    Bedon, Chiara
    Markovic, Damijan
    Karlos, Vasilis
    Larcher, Martin
    COUPLED SYSTEMS MECHANICS, 2023, 12 (02): : 167 - 181
  • [23] Resolution of near-field to near-field imaging with silver nanolayer
    Stefaniuk, Tomasz
    Wrobel, Piotr
    Borysiuk, Jolanta
    Szoplik, Tomasz
    METAMATERIALS VIII, 2013, 8771
  • [24] Fast and Efficient Near-field to Near-field and Near-field to Far-field Transformation based on the Spherical Wave Expansion
    Boesman, B.
    Pissoort, D.
    Gielen, G.
    Vandenbosch, G. A. E.
    2015 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC), 2015, : 529 - 534
  • [25] Numerical Study of the of Sonic Boom Near-Field
    Mishchenko, P. A.
    Kiseleva, T. A.
    HIGH ENERGY PROCESSES IN CONDENSED MATTER (HEPCM 2019), 2019, 2125
  • [26] STUDY OF POLARIZATION SENSITIVITY OF NEAR-FIELD MICROSCOPE
    Khonina, S. N.
    Alferov, S. V.
    Karpeev, S. V.
    Moiseev, O. Yu.
    COMPUTER OPTICS, 2013, 37 (03) : 326 - 331
  • [27] The study and analysis of near-field light intensity
    Wang, KY
    Jin, Z
    Huang, WH
    INTERNATIONAL CONFERENCE ON HOLOGRAPHY AND OPTICAL INFORMATION PROCESSING (ICHOIP '96), 1996, 2866 : 191 - 197
  • [28] Study of the near-field optical intensity gradients
    Yang, CW
    Tsai, DP
    SCANNING, 1999, 21 (02) : 74 - 75
  • [29] IDENTIFIABILITY STUDY OF NEAR-FIELD AUTOMOTIVE SAR
    Shifrin, Michael
    Tabrikian, Joseph
    Bilik, Igal
    2024 IEEE INTERNATIONAL CONFERENCE ON ACOUSTICS, SPEECH AND SIGNAL PROCESSING (ICASSP 2024), 2024, : 8826 - 8830
  • [30] Study of near-field emission of semiconductor laser
    Gaikovich, KP
    Dryakhlushin, VF
    Levichev, VV
    Mishkin, VP
    PHYSICS OF LOW-DIMENSIONAL STRUCTURES, 2003, 3-4 : 55 - 59