A reliable method for extraction of material parameters in terahertz time-domain spectroscopy

被引：854
|
作者：
Duvillaret, L
Garet, F
Coutaz, JL
机构：
[1] Lab. d'Hyperfrequences C., Université de Savoie
[2] University of Paris XI, Orsay
[3] Lab. Microwaves and Characterization, University of Savoy, Chambéry
来源：
IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS | 1996年 / 2卷 / 03期
关键词：
D O I：
10.1109/2944.571775
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper introduces a never method that allows fast and reliable extraction of material parameters in terahertz time-domain spectroscopy, This method could be applied for most of materials and requires neither simplifying assumptions nor samples of different thickness for the extraction, The presented extraction procedure operates either on truncated terahertz signals when temporal windowing is possible, or on full ones otherwise. Some experimental examples covering all practical cases are given, In particular, the extraction procedure treats the tedious case of samples for which internal reflections of the terahertz pulse slightly overlap.
引用
收藏
页码：739 / 746
页数：8
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