Investigation of antiferroelectric liquid crystalline free-standing films by transmission ellipsometry

被引：10
|
作者：
Kobayashi, H
Matsuhashi, N
Okumoto, Y
Akahane, T
机构：
[1] Nagaoka Univ Technol, Fac Engn, Dept Elect Engn, Nagaoka, Niigata 9402188, Japan
[2] Hachinohe Natl Coll Technol, Dept Elect Engn, Hachinohe, Aomori 0391192, Japan
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1999年 / 38卷 / 11期
关键词：
antiferroelectric liquid crystals; free standing film; ellipsometry;
D O I：
10.1143/JJAP.38.6428
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Thin free-standing films (FSFs) of an antiferroelectric liquid crystal (AFLC) were investigated by transmission ellipsometry. The phase difference between p-polarized and s-polarized light was measured as a function of the temperature and the incidence angle of the light beam. It was found that the structure of an FSF with two layers is anticlinic (SmCA*) throughout the temperature range investigated whereas the bulk sample shows several phases, from SmCA* to SmA phases. The four layer FSF showed only one phase transition (from SmCA* to SmA) in this temperature range. Even for such a thin film as one with five layers, a subphase or subphases between SmCA* and SmA were found.
引用
收藏
页码：6428 / 6432
页数：5
相关论文
共 50 条
  • [31] Femtosecond nonlinear transmission study of free-standing porous silicon films
    Klimov, V
    McBranch, D
    Karavanskii, V
    SURFACE/INTERFACE AND STRESS EFFECTS IN ELECTRONIC MATERIALS NANOSTRUCTURES, 1996, 405 : 179 - 184
  • [32] Positron implantation and transmission experiments on free-standing nanometric polymer films
    Palacio, C. A.
    De Baerdemaeker, J.
    Segers, D.
    Mostafa, K. M.
    Van Thourhout, D.
    Dauwe, C.
    POSITRON AND POSITRONIUM CHEMISTRY, 2009, 607 : 105 - +
  • [33] Switching Dynamics and Improved Efficiency of Free-Standing Antiferroelectric Capacitors
    Saeed, Umair
    Pesquera, David
    Liu, Ying
    Fina, Ignasi
    Ganguly, Saptam
    Santiso, Jose
    Padilla-Pantoja, Jessica
    Roque, Jose Manuel Caicedo
    Liao, Xiaozhou
    Catalan, Gustau
    ADVANCED ELECTRONIC MATERIALS, 2024, 10 (10):
  • [34] Structures and phase transitions in thin free standing films of an antiferroelectric liquid crystal
    Conradi, M
    Cepic, M
    Copic, M
    Musevic, I
    PHYSICAL REVIEW LETTERS, 2004, 93 (22)
  • [35] Characterization of free-standing thin crystalline films on porous silicon for solar cells
    Solanki, CS
    Bilyalov, RR
    Poortmans, J
    Beaucarne, G
    Van Nieuwenhuysen, K
    Nijs, J
    Mertens, R
    THIN SOLID FILMS, 2004, 451 : 649 - 654
  • [36] Determining thickness and refractive index from free-standing ultrathin polymer films with spectroscopic ellipsometry
    Hilfiker, James N.
    Stadermann, Michael
    Sun, Jianing
    Tiwald, Tom
    Hale, Jeffrey S.
    Miller, Philip E.
    Aracne-Ruddle, Chantel
    APPLIED SURFACE SCIENCE, 2017, 421 : 508 - 512
  • [37] Meniscus and dislocations in free-standing films of smectic-A liquid crystals
    Geminard, JC
    Holyst, R
    Oswald, P
    PHYSICAL REVIEW LETTERS, 1997, 78 (10) : 1924 - 1927
  • [38] Electrosyntheses of free-standing and highly conducting polyselenophene films in an ionic liquid
    Dong, Bin
    Xing, Yaohui
    Xu, Jingkun
    Zheng, Liqiang
    Hou, Jian
    Zhao, Feng
    ELECTROCHIMICA ACTA, 2008, 53 (19) : 5745 - 5751
  • [39] Optical studies on free-standing films of an achiral smectic liquid crystal
    Han, XF
    Wang, ST
    Cady, A
    Liu, ZQ
    Findeisen, S
    Weissflog, W
    Huang, CC
    PHYSICAL REVIEW E, 2003, 68 (06):
  • [40] Characterization of Free-Standing Nano-Membranes by Using Ellipsometry
    Sungmo Park
    Changho Lee
    Ilsin An
    Min-Su Kim
    Jin-Goo Park
    Jin-ho Ahn
    Journal of the Korean Physical Society, 2018, 72 : 868 - 872
12345