Characterization of self-assembling isolated ferroelectric domains by scanning force microscopy

被引：4
|
作者：
Lee, B
Bae, C
Kim, SH
Shin, H
机构：
[1] Kookmin Univ, Sch Adv Mat Engn, Seoul 136702, South Korea
[2] Inostek Inc, Seoul 153023, South Korea
来源：
ULTRAMICROSCOPY | 2004年 / 100卷 / 3-4期
关键词：
D O I：
10.1016/j.ultramic.2003.12.015
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
Lead zirconate titanate (PZT) thin films were prepared by a sol-gel process on, platinized Si substrate. Their microstructure and surface morphology were characterized by XRD and Scanninn Force Microscopy. Phase transformation of the prepared PZT films from pyrochlore to ferroelectric was observed. by XRD and PFM (piezoresponse force microscopy), respectively. Self-assembling nano-structured ferroelectric phases are fabricated by solution deposition technique followed by the controlling kinetics of the transformation. Complex structures of ferroelectric domains in the isolated ferroelectric phases were found. in the furnace annealed PZT films in the temperature range of 400-500degreesC. Single ferroelectric domain structured in the isolated ferroelectric phases could be found in thinner PZT films and used to study the size effect of laterally confined ferroelectric domains. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码：339 / 346
页数：8
相关论文
共 50 条
  • [1] On the imaging mechanism of ferroelectric domains in scanning force microscopy
    Gruverman, A
    Tokumoto, H
    [J]. NANO LETTERS, 2001, 1 (02) : 93 - 95
  • [2] Kinetics of ferroelectric domains investigated by scanning force microscopy
    Likodimos, V
    Labardi, M
    Allegrini, M
    [J]. PHYSICAL REVIEW B, 2000, 61 (21): : 14440 - 14447
  • [3] Contrast mechanisms for the detection of ferroelectric domains with scanning force microscopy
    Jungk, Tobias
    Hoffmann, Akos
    Soergel, Elisabeth
    [J]. NEW JOURNAL OF PHYSICS, 2009, 11
  • [4] Scanning force microscopy: Application to nanoscale studies of ferroelectric domains
    Gruverman, A
    Auciello, O
    Tokumoto, H
    [J]. INTEGRATED FERROELECTRICS, 1998, 19 (1-4) : 49 - 83
  • [5] Ferroelectric domains and domain boundaries observed by scanning force microscopy
    Eng, LM
    Fousek, J
    Gunter, P
    [J]. FERROELECTRICS, 1997, 191 (1-4) : 419 - 426
  • [6] Contrast mechanism for visualization of ferroelectric domains with scanning force microscopy
    Jungk, T.
    Soergel, E.
    [J]. FERROELECTRICS, 2006, 334 : 29 - 34
  • [7] SCANNING FORCE MICROSCOPY AS A TOOL FOR NANOSCALE STUDY OF FERROELECTRIC DOMAINS
    Gruverman, Alexei
    Auciello, Orlando
    Hatano, Jun
    Tokumoto, Hiroshi
    [J]. FERROELECTRICS, 1996, 184 : 11 - 20
  • [8] STATICS AND DYNAMICS OF FERROELECTRIC DOMAINS STUDIED WITH SCANNING FORCE MICROSCOPY
    LUTHI, R
    HAEFKE, H
    GUTMANNSBAUER, W
    MEYER, E
    HOWALD, L
    GUNTHERODT, HJ
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (04): : 2451 - 2455
  • [9] Atomic force microscopy of programmable, self-assembling tecto-RNAS.
    Koyfman, AY
    Chworos, A
    Oroudjev, E
    Magono, S
    Hansma, HG
    Jaeger, L
    [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2004, 227 : U1003 - U1003
  • [10] STATIC AND DYNAMIC STRUCTURES OF FERROELECTRIC DOMAINS STUDIED WITH SCANNING FORCE MICROSCOPY
    Haefke, H.
    Luthi, R.
    Meyer, K. -P.
    Guntherodt, H. -J.
    [J]. FERROELECTRICS, 1994, 151 (01) : 143 - 149
12345