Flexible Testbed for 5G Waveform Generation and Analysis

被引：0
|
作者：
Jue, Greg [1 ]
机构：
[1] Keysight Technol Inc, Santa Rosa, CA 95403 USA
来源：
MICROWAVE JOURNAL | 2015年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
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页码：12 / 14
页数：3
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