Copper-phthalocyanine ultra thin films grown onto Al(100) surface investigated by synchrotron radiation

被引：31

作者：

Ruocco, A

Evangelista, F

Attili, A

Donzello, MP

Betti, MG

Giovanelli, L

Gotter, R

机构：

[1] Univ Roma Tre, INFM, Unita Roma Tre, I-00146 Rome, Italy

[2] Univ Roma Tre, Dipartimento Fis, I-00146 Rome, Italy

[3] INFM, Lab Nazl TASC, I-34012 Trieste, Italy

[4] Univ Roma La Sapienza, INFM, Unita Roma Uno, I-00185 Rome, Italy

[5] Univ Roma La Sapienza, Dipartimento Fis, I-00185 Rome, Italy

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 2004年 / 137卷

关键词：

copper-phthalocyanine; Al(100); core level photoemission; organic molecule; polarization dependent X-ray absorption;

D O I：

10.1016/j.elspec.2004.02.092

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

In this work X-ray photoemission spectroscopy (XPS) and X-ray absorption spectroscopy (XAS) are employed to study the CuPc/Al(1 0 0) organic-inorganic interface. The C ls core level, investigated for three different coverages, shows sharp differences in passing from bulk to monolayer range CuPc film: in particular the shake-up satellite is not visible in the early stages of adsorption, suggesting a strong molecule-substrate interaction. XAS at the Cu L-3 edge was employed to study the molecular orientation with respect to the substrate. In the case of a 40 Angstrom CuPc film the molecular plane was found to be almost perpendicular to the substrate surface. (C) 2004 Elsevier B.V. All rights reserved.

引用

页码：165 / 169

页数：5

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