Quadraxial probe for high resolution near-field scanning rf/microwave microscopy

被引：11
|
作者：
Karbassi, A. [1 ]
Paulson, C. A. [1 ]
Kozyrev, A. B. [1 ]
Banerjee, M. [1 ]
Wang, Y. [1 ]
van der Weide, D. W. [1 ]
机构：
[1] Univ Wisconsin, Dept Elect & Comp Engn, Madison, WI 53706 USA
来源：
APPLIED PHYSICS LETTERS | 2006年 / 89卷 / 15期
关键词：
D O I：
10.1063/1.2358945
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The authors propose and demonstrate a miniaturized quadraxial probe that employs a differential feed technique for use in near-field rf/microwave transmission microscopy. Their quadraxial probe's electric field measurements show higher electric field localization than a conventional coaxial (monopole) probe. The improved spatial resolution and more sensitive phase measurement of the quadraxial probe versus coaxial probe are further validated by a metal line scan experiment. (c) 2006 American Institute of Physics.
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页数：3
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