Determination and analysis of dispersive optical constant of TiO2 and Ti2O3 thin films

被引:109
|
作者
Abdel-Aziz, M. M. [1 ]
Yahia, I. S.
Wahab, L. A.
Fadel, M.
Afifi, M. A.
机构
[1] Ain Shams Univ, Dept Phys, Fac Educ, Cairo, Egypt
[2] Natl Ctr Radiat Res & Technol, Dept Phys, Nasr City, Cairo, Egypt
关键词
titanium oxides; optical dispersion parameters; dielectric constant;
D O I
10.1016/j.apsusc.2005.10.040
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Electron beam evaporation technique was used to prepare TiO2 and Ti2O3 thin films onto glass substrates of thicknesses 50, 500 and 1000 run for each sample. The structural investigations revealed that the as-deposited films are amorphous in nature. Transmittance measurements in the wavelength range (350-2000 nm) were used to calculate the refractive index n and the absorption index k using Swanepoel's method. The optical constants such as optical band gap E-g(opt), optical conductivity sigma(opt), complex dielectric constant, relaxation time tau and dissipation factor tan 8 were determined. The analysis of the optical absorption data revealed that the optical band gap E-g was indirect transitions. The optical dispersion parameters E-o and E-d were determined according to Wemple and Didomenico method. (c) 2005 Published by Elsevier B.V.
引用
收藏
页码:8163 / 8170
页数:8
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