共 50 条
- [31] A model based approach to reference-free straightness measurement at the Nanometer Comparator MODELING ASPECTS IN OPTICAL METROLOGY II, 2009, 7390
- [32] Refining the pattern-based reference model for electronic invoices by incorporating threats FIFTH INTERNATIONAL CONFERENCE ON AVAILABILITY, RELIABILITY, AND SECURITY: ARES 2010, PROCEEDINGS, 2010, : 560 - 564
- [34] On-axis diffuse screen based on a reference-free volume hologram Technical Physics, 2005, 50 : 274 - 275
- [36] Reference pattern-based 2D measurement with nano resolution OPTOMECHATRONIC MICRO/NANO DEVICES AND COMPONENTS II, 2006, 6376
- [37] Reference-free deconvolution, visualization and interpretation of complex DNA methylation data using DecompPipeline, MeDeCom and FactorViz Nature Protocols, 2020, 15 : 3240 - 3263