Far-infrared ellipsometry using a synchrotron light source -: the dielectric response of the cuprate high Tc superconductors

被引：71
|
作者：
Bernhard, C
Humlícek, J
Keimer, B
机构：
[1] Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany
[2] Masaryk Univ, Brno, Czech Republic
来源：
THIN SOLID FILMS | 2004年 / 455卷
关键词：
superconductors; dielectric; ellipsometer;
D O I：
10.1016/j.tsf.2004.01.002
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We describe the setup of an ellipsometer for the far- to mid-infrared (FIR-MIR) spectral range that is used in combination with a Fourier-transform infrared (FTIR) spectrometer and a synchrotron light source. We present the outline of the ellipsometer and discuss how it has been optimized in order to perform accurate ellipsometric measurements on relatively small single crystals of the cuprate high-T-c superconductors (HTSC) and other oxide based compounds with strongly correlated charge carriers. We present ellipsometric spectra for the HTSC compounds B2Sr2CaCu2O8+delta, and YBa2Cu3O6.95. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码：143 / 149
页数：7
相关论文
共 50 条
  • [41] FAR-INFRARED SPECTRA OF ND-BASED HIGH-TEMPERATURE SUPERCONDUCTORS
    CLAYMAN, BP
    WANG, SH
    SONG, Q
    PHYSICA B, 1990, 165 : 1233 - 1234
  • [42] Far-infrared thermal spectroscopy of low-Tc and high-Tc superconductor films
    Tesar, R
    Kolácek, J
    Kawate, E
    Benacka, S
    Gazi, S
    Simsa, Z
    SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 2003, 16 (08): : 916 - 921
  • [43] Far-infrared dielectric and vibrational properties of nonstoichiometric wustite at high pressure
    Seagle, Christopher T.
    Zhang, Wenxuan
    Heinz, Dion L.
    Liu, Zhenxian
    PHYSICAL REVIEW B, 2009, 79 (01):
  • [44] Far infrared ellipsometry using synchrotron radiation: The out-of-plane response of La2-xSrxCuO4
    Henn, R.
    Bernhard, C.
    Wittlin, A.
    Cardona, M.
    Uchida, S.
    Thin Solid Films, 1998, 313-314 (1-2): : 642 - 648
  • [45] Far infrared ellipsometry using synchrotron radiation:: the out-of-plane response of La2-xSrxCuO4
    Henn, R
    Bernhard, C
    Wittlin, A
    Cardona, M
    Uchida, S
    THIN SOLID FILMS, 1998, 313 : 642 - 648
  • [46] Micro far-infrared dielectric response of lanthanide orthotantalates for applications in microwave circuitry
    Dias, Anderson (anderson_dias@iceb.ufop.br), 1600, Elsevier Ltd (693):
  • [47] Micro far-infrared dielectric response of lanthanide orthotantalates for applications in microwave circuitry
    Dias, Anderson
    Siqueira, Kisla P. F.
    Moreira, Roberto L.
    JOURNAL OF ALLOYS AND COMPOUNDS, 2017, 693 : 1243 - 1249
  • [48] Synchrotron-Based High Resolution Far-Infrared Spectroscopy of trans-Butadiene
    Martin-Drumel, Marie-Aline
    Porterfield, Jessica P.
    Goubet, Manuel
    Asselin, Pierre
    Georges, Robert
    Soulard, Pascale
    Nava, Matthew
    Changala, P. Bryan
    Billinghurst, Brant
    Pirali, Olivier
    McCarthy, Michael C.
    Baraban, Joshua H.
    JOURNAL OF PHYSICAL CHEMISTRY A, 2020, 124 (12): : 2427 - 2435
  • [49] Self-consistent gauge-invariant theory of the in-plane infrared response of high-Tc cuprate superconductors
    Chaloupka, Jiri
    Munzar, Dominik
    PHYSICAL REVIEW B, 2007, 76 (21):
  • [50] Far-infrared dielectric functions and phonon spectra of BexZn1-xTe alloys determined by spectroscopic ellipsometry
    Mandal, N.
    Peiris, F. C.
    Maksimov, O.
    Tamargo, M. C.
    SOLID STATE COMMUNICATIONS, 2009, 149 (39-40) : 1698 - 1701
12345