Nano-diffraction in STEM and fluctuation electron microscopy of phase-change material

被引：0
|
作者：
Bornhoefft, Manuel [1 ,2 ]
Saltzmann, Tobias [3 ]
Benke, Julia [4 ]
Voyles, Paul M. [5 ]
Simon, Ulrich [3 ,6 ]
Wuttig, Matthias [4 ,6 ]
Mayer, Joachim [1 ,2 ,6 ]
机构：
[1] Rhein Westfal TH Aachen, Cent Facil Electron Microscopy, Aachen, Germany
[2] Forschungszentrum Julich, Ernst Ruska Ctr, Julich, Germany
[3] Rhein Westfal TH Aachen, Inst Anorgan Chem, Aachen, Germany
[4] Rhein Westfal TH Aachen, Phys Inst IA 1, Aachen, Germany
[5] Univ Wisconsin, Dept Mat Sci & Engn, Madison, WI 53706 USA
[6] Rhein Westfal TH Aachen, JARA Fundamentals Future Informat Technol, Aachen, Germany
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2015年 / 71卷
关键词：
Nano-diffraction; TEM; STEM; phase-change; FEM;
D O I：
10.1107/S2053273315095637
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
MS13-P1
引用
收藏
页码：S286 / S286
页数：1
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