Energy dispersive X-ray diffraction

被引:28
|
作者
Kaempfe, Bernd
Luczak, Falk
Michel, Bernd
机构
[1] Ingn Luczak, D-10245 Berlin, Germany
[2] Fraunhofer Inst Zuverlassigkeit & Mikrointegrat, D-12489 Berlin, Germany
[3] Fraunhofer Inst Zuverlassigkeit & Mikrointegrat, D-13355 Berlin, Germany
关键词
combined chemical and structure analysis; comparison of angle dispersive and energy-dispersive diffraction; stress analysis in thin films; particle size determination; X-ray diffraction;
D O I
10.1002/ppsc.200501007
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The important advantage of energy-dispersive X-ray diffraction is the opportunity to obtain diffraction patterns without the use of any goniometer. Thus, a combination of small power X-ray tubes, appropriate X-ray optics and high energy-resolution detectors enables the construction of small and transportable measurement devices also for mobile use. Specimens of different size, shape, and geometry can be investigated. In this article, the application of energy-dispersive X-ray diffraction on polycrystalline materials is demonstrated and examples in the fields of micro system technologies, deposition techniques and quality control are presented.
引用
收藏
页码:391 / 396
页数:6
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