Diffraction peaks restoration and extraction in energy dispersive X-ray diffraction

被引:6
|
作者
Soulez, Ferreol [1 ,2 ]
Crespy, Charles [1 ]
Kaftandjian, Valerie [1 ]
Duvauchelle, Philippe [1 ]
机构
[1] Univ Lyon, Lab Controle Non Destructif Rayonnements Ionisant, Insa Lyon, F-69621 Villeurbanne, France
[2] Univ Lyon 1, Ctr Commun Quantimetrie, F-69373 Lyon 08, France
关键词
Energy dispersive X-ray diffraction; Non-destructive testing; Spectrum restoration; Inverses problems; SPECTRA; SYSTEM;
D O I
10.1016/j.nima.2011.06.037
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
This paper proposes a method to restore energy dispersive X-ray diffraction (EDXRD) spectra and to extract diffraction peaks. It follows a maximum a posteriori approach using a physical model of the formation of the EDXRD data to remove blur caused by both the detector and the coarse angular resolution of X-ray tube based EDXRD setup. It separates peaks due to the diffraction by crystalline material from a continuous background. Tested on real data (graphite and NaCl), our algorithm achieved to detect diffraction peaks with a good precision (about 1 key depending on the peak position) even at high energy where very few photons were measured. (C) 2011 Elsevier B.V. All rights reserved.
引用
收藏
页码:441 / 449
页数:9
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