Near Field Probe for Detecting Resonances in EMC Application

被引：0
|
作者：
Xiao, Jiang [1 ]
Liu, Dazhao [1 ]
Pommerenke, David [1 ]
Huang, Wei [1 ]
Shao, Peng [1 ]
Li, Xiang [1 ]
Min, Jin [2 ]
Muchaidze, Giorgi [2 ]
机构：
[1] Missouri Univ Sci & Technol, EMC Lab, Rolla, MO 65401 USA
[2] Amber Precis Instruments, Santa Clara, CA 95054 USA
来源：
2010 ASIA-PACIFIC INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY & TECHNICAL EXHIBITION ON EMC RF/MICROWAVE MEASUREMENTS & INSTRUMENTATION | 2010年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Resonances degrade the product's EMI or immunity performance at resonance frequencies. Near field scanning techniques, like EMI scanning or susceptibility scanning determine the local behaviour, but fail to connect the local behaviour to the system level behaviour. Resonating structures form part of the coupling paths, i.e., identifying them will aid in understanding system level behaviour of products. In this article, a near field probe (patent pending) is proposed to detecting the resonances frequencies, locations or resonating structures and their Q-factors. The probe is suitable for integration into an automatic scanning system for analysing resonances of PCBs, cables, structural elements etc. The mechanism of the probe has been verified with full wave tools (CST MWS and Ansoft HFSS). Two samples of application are presented.
引用
收藏
页码：243 / 246
页数：4
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