Guest Editorial: Special Issue on the 2013 IEEE International Instrumentation and Measurement Technology Conference Minneapolis, MN, USA, May 6-9, 2013

被引：0

作者：

Petri, Dario ^{[1
,2
,3
]}

Kharkovsky, Sergey ^{[4
,5
]}

机构：

[1] Univ Padua, Dept Elect & Informat Engn, I-35100 Padua, Italy

[2] Univ Perugia, I-06100 Perugia, Italy

[3] Univ Trento, Dept Informat Engn & Comp Sci, Trento, Italy

[4] Cukurova Univ, Adana, Turkey

[5] Missouri Univ Sci & Technol, Elect & Comp Engn Dept, Appl Microwave Nondestruct Lab, Rolla, MO USA

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 2014年 / 63卷 / 05期

关键词：

D O I：

10.1109/TIM.2014.2311906

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：991 / 992

页数：2

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