Design of an area and energy-efficient last-level cache memory using STT-MRAM

被引:7
|
作者
Saha, Rajesh [1 ]
Pundir, Yogendra Pratap [1 ,2 ]
Pal, Pankaj Kumar [1 ]
机构
[1] Natl Inst Technol Uttarakhand, Dept Elect Engn, Srinagar 246174, Uttarakhand, India
[2] Hemvati Nandan Bahuguna Garhwal Univ, Dept Elect & Commun Engn, Srinagar 246174, Uttarakhand, India
关键词
Magnetic tunnel junction (MTJ); Gate-all-around; Spin transfer torque; MRAM Last level cache; Energy efficient circuits;
D O I
10.1016/j.jmmm.2021.167882
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper presents an area and energy-efficient non-volatile Last-level Cache (LLC) using a STT-MRAM based on a state-of-art perpendicular magnetic tunnel junction (pMTJ) and an Vertical Gate-All-Around Field-Effect Transistor (GAA-FET). This work presented, in this article is carried out from device to circuit, architecture and up to the system level. A detailed analysis of STT-MRAM has been presented by comparing an Vertical GAA-FET (GA) with a bulk-FET (B) at cell level. It is observed that GA-STT-MRAM is advantageous and offers 93.10% and 60% reduction in leakage-power dissipation and area, respectively over B-STT-MRAM. Furthermore, at architecture level, 20% to 80% reduction in sizes of LLCs (ranging from 512 KB to 64 MB) is observed by using GASTT-MRAM and around 80.78% leakage power reduction is achieved in comparison to SRAM based LLCs. In addition to the architecture level, GA-STT-MRAM is found to have 83.26% and 39.40% energy reduction compared to a B-STT-MRAM and a conventional SRAM, respectively at system level. The GA-STT-MRAM proves to be a more promising candidate to replace conventional semiconductor based LLC for next-generation energy-efficient microprocessors having on-chip non-volatility.
引用
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页数:8
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