Analysis of dielectric-loaded cavities using an orthonormal-basis method

被引：26
|
作者：
Monsoriu, JA [1 ]
Andrés, MV
Silvestre, E
Ferrando, A
Gimeno, B
机构：
[1] Univ Valencia, Inst Ciencia Mat, Dept Fis Aplicada, E-46100 Burjassot, Spain
[2] Univ Valencia, Dept Opt, E-46100 Burjassot, Spain
来源：
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 2002年 / 50卷 / 11期
关键词：
dielectric resonators; moment methods;
D O I：
10.1109/TMTT.2002.804648
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
An orthonormal-basis method to analyze dielectric-loaded cavities is proposed. Resonant frequencies and fields are obtained by solving an eigenvalue problem in which the modes of an auxiliary problem define the orthonormal-basis that is used to expand the fields of the original problem. The merit of our approach is to take advantage of some mathematical properties to develop a computationally efficient and versatile method. The accuracy of the method is demonstrated by comparing our results with other results available in the literature.
引用
收藏
页码：2545 / 2552
页数：8
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