Analysis of dielectric-loaded cavities using an orthonormal-basis method

被引：26

作者：

Monsoriu, JA ^{[1
]}

Andrés, MV

Silvestre, E

Ferrando, A

Gimeno, B

机构：

[1] Univ Valencia, Inst Ciencia Mat, Dept Fis Aplicada, E-46100 Burjassot, Spain

[2] Univ Valencia, Dept Opt, E-46100 Burjassot, Spain

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 2002年 / 50卷 / 11期

关键词：

dielectric resonators; moment methods;

D O I：

10.1109/TMTT.2002.804648

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An orthonormal-basis method to analyze dielectric-loaded cavities is proposed. Resonant frequencies and fields are obtained by solving an eigenvalue problem in which the modes of an auxiliary problem define the orthonormal-basis that is used to expand the fields of the original problem. The merit of our approach is to take advantage of some mathematical properties to develop a computationally efficient and versatile method. The accuracy of the method is demonstrated by comparing our results with other results available in the literature.

引用

页码：2545 / 2552

页数：8

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