Visualizing polymeric liquid/solid interfaces by atomic force microscopy utilizing quartz tuning fork sensors

被引:10
|
作者
Yamada, Yuya [1 ]
Ichii, Takashi [1 ]
Utsunomiya, Toru [1 ]
Sugimura, Hiroyuki [1 ]
机构
[1] Kyoto Univ, Grad Sch Engn, Dept Mat Sci & Engn, Kyoto 6068501, Japan
关键词
VISCOELASTIC PROPERTIES; SHEAR ELASTICITY; SOLID-SURFACES; FILMS; FRICTION; LUBRICATION;
D O I
10.35848/1347-4065/ab84b0
中图分类号
O59 [应用物理学];
学科分类号
摘要
We investigated a polymeric liquid/solid interface by frequency modulation atomic force microscopy (FM-AFM) using a quartz tuning fork sensor, so-called qPlus sensor. We carried out topographic imaging on a muscovite mica surface in poly(dimethylsiloxane) (PDMS) which has 1000 times higher viscosity than that of water and the crystal structure of the mica surface was successfully imaged. Two-dimensional frequency shift mapping was also demonstrated at the interface and the layered structure of density distribution of the PDMS was imaged. The monotonic energy dissipation curve indicated the fluid-like behavior of the PDMS near the mica surface. In addition, lateral variation of density distribution was also imaged. The results in this work indicated usefulness of FM-AFM using qPlus sensors for lubrication study. (C) 2020 The Japan Society of Applied Physics
引用
收藏
页数:5
相关论文
共 50 条
  • [1] Frequency Modulation Atomic Force Microscopy in Ionic Liquid Using Quartz Tuning Fork Sensors
    Ichii, Takashi
    Fujimura, Motohiko
    Negami, Masahiro
    Murase, Kuniaki
    Sugimura, Hiroyuki
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2012, 51 (08)
  • [2] Characterization of strongly coupled quartz tuning fork sensors for precision force measurement in atomic force microscopy
    Shaskey, Cedric
    Jarzembski, Amun
    Jue, Andrew
    Park, Keunhan
    ULTRAMICROSCOPY, 2024, 267
  • [3] EIGENVALUE VEERING IN QUARTZ TUNING FORK SENSORS AND ITS EFFECT ON DYNAMIC ATOMIC FORCE MICROSCOPY
    Melcher, John
    PROCEEDINGS OF THE ASME INTERNATIONAL DESIGN ENGINEERING TECHNICAL CONFERENCES AND COMPUTERS AND INFORMATION IN ENGINEERING CONFERENCE, 2014, VOL 4, 2014,
  • [4] Atomic Force Microscopy Sidewall Imaging with a Quartz Tuning Fork Force Sensor
    Hussain, Danish
    Wen, Yongbing
    Zhang, Hao
    Song, Jianmin
    Xie, Hui
    SENSORS, 2018, 18 (01):
  • [5] Force-gradient-induced mechanical dissipation of quartz tuning fork force sensors used in atomic force microscopy
    Castellanos-Gomez, A.
    Agrait, N.
    Rubio-Bollinger, G.
    ULTRAMICROSCOPY, 2011, 111 (03) : 186 - 190
  • [6] Noncontact friction force microscopy based on quartz tuning fork sensors
    Labardi, M.
    Allegrini, M.
    APPLIED PHYSICS LETTERS, 2006, 89 (17)
  • [7] Noncontact atomic force microscopy in liquid environment with quartz tuning fork and carbon nanotube probe
    Kageshima, M
    Jensenius, H
    Dienwiebel, M
    Nakayama, Y
    Tokumoto, H
    Jarvis, SP
    Oosterkamp, TH
    APPLIED SURFACE SCIENCE, 2002, 188 (3-4) : 440 - 444
  • [8] Enhancement of Q factor in quartz tuning fork force sensors for atomic force microscopy through counter piezo excitation
    Kinoshita, Yukinori
    Kamo, Yoshiki
    MECHANICAL ENGINEERING JOURNAL, 2024, 11 (04):
  • [9] Dynamics of quartz tuning fork force sensors used in scanning probe microscopy
    Castellanos-Gomez, A.
    Agrait, N.
    Rubio-Bollinger, G.
    NANOTECHNOLOGY, 2009, 20 (21)
  • [10] Equivalent Electromechanical Model for Quartz Tuning Fork Used in Atomic Force Microscopy
    Lin, Rui
    Qian, Jianqiang
    Li, Yingzi
    Cheng, Peng
    Wang, Cheng
    Li, Lei
    Gao, Xiaodong
    Sun, Wendong
    SENSORS, 2023, 23 (08)